基本释义:

设计可行性测试

网络释义

1)design feasibility test,设计可行性测试

2)Design for testability,可测试性设计

3)design-for-testability,可测试性设计

4)DFT,可测试性设计

5)design for test,可测试性设计

6)Design For Test (DFT),可测试性设计(DFT)

用法和例句

Because of the high integration characteristic of resonant tunneling diode (RTD) circuits, design for testability is significantly important to simplify the RTD circuits testing.

针对共振隧穿二极管(RTD)电路由于具有超高集成度特点所带来的电路测试困难,在故障分析与故障模型的基础上提出了RTD电路的可测试性设计方案。

Boundary Scan Technique (BST) is a new and effective way of test and design for testability for VLSI circuits.

1边界扫描机制是一种新型的VLSI电路测试及可测试性设计的有效方法,为了高效地应用边界扫描机制对电路系统进行测试,必须对其所涉及的理论方法进行深入探讨。

The idea of test and design for testability is discussed, the challenges of test and design for testability are analyzed, then the test and design for testability in SOC design are discussed.

CMOS器件进入超深亚微米阶段,集成电路(IC)继续向高集成度、高速度、低功耗发展,使得IC在测试和可测试性设计上都面临新的挑战。

A comprehensive survey of the up-to-date design-for-testability (DFT) methods and testing technologies for system-on-a-chip (SOC) is presented.

对SOC可测试性设计与测试技术的国际研究现状及进展进行了广泛而深入的综述。

SoC DFT Design Based on Function and ESL Debug;

基于功能的SoC可测试性设计及系统级调试

Research on DFT Techniques for a Kind of Intelligent Communication Board;

一种智能通信板的可测试性设计研究

Aiming at the difficult situation of the inspecting and test system of “ground to air” missile,the means of design for testability (DFT) in “ground to air” missile based on the technology of DFT are introduced.

阐述了地空导弹武器系统可测试性设计的必要性 ,论述了可测性设计的基本理论 ,分析了地空导弹武器系统可测性设计涉及的相关问题。

Design and Analysis for Testability in Software of Equipment ATS

装备自动测试系统软件的可测试性设计与分析

Research on DFT Techniques for High-Performance General-Purposed Processors;

高性能通用处理器的可测试性设计研究

Testability Feature of an HDTV Channel Receiver Chip

高清晰度电视信道接收芯片的可测试性设计

Research on Design for Test Methodology for Core Based SOC Architecture;

基于SOC架构的可测试性设计策略的研究

DFT Study of Digital Circuit Based on LASAR;

基于LASAR的数字电路可测试性设计方法研究

Design Validation and Usability Testing

设计验证和可用性测试

Testable Design and Testing for the OR-Coincidence Logic System;

或—符合逻辑系统的可测性设计与测试

The DFT and Test Generation of Garfield;

Garfield芯片的可测性设计及测试生成

The Research on SoC Test and Design for Testability;

系统级芯片的测试与可测性设计研究

Design-for-Testability and Test of Garfield Series SoC’s

Garfield系列SoC芯片可测性设计与测试

Research and Realization of Reliability Testing System of Pneumatic Cylinder

一种气缸可靠性测试系统设计与实现

Reliability design on radar automatic test instrument

雷达接收机自动测试系统可靠性设计

Reliability Design and Analysis on Test-bed of Performance Test of Dual-mass Flywheel

双质量飞轮性能测试试验台可靠性设计分析

DFM Based Research and Test Chip Design

基于可制造性设计研究及测试芯片设计

The Researches on Mixed-Signal Test and Design for Testability;

数模混合信号芯片的测试与可测性设计研究

Research on Circuit Fault Diagnosis and Low-Power Test;

电路故障诊断可测性设计及低功耗测试研究

VLSI Auto Testing and Design for Test;

集成电路自动测试方法及可测性设计研究

Research on Design for Testability and Test Algorithm of Embedded Memory

嵌入式存储器的可测性设计及测试算法研究